LTX Tester CANDENA PVI ALARM IN TEST NO 660 (S_IX_IV_VI_S)-->1

Reduce ALARM in PVI
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begin pvi sequence SEQ_VCLAMP
if wafer_test then
gate pvi chan gnd_pvi on with timeout of 100ms
end_if
set pvi sequencer wait 100us
gate pvi chan out_pvi on with timeout of 10ms
set pvi sequencer wait t_meas
measure pvi v on chan out_pvi average 5 into local 2 delayed by 30us
set pvi sequencer wait (t_pulse-t_meas)
gate pvi chan out_pvi off
set pvi sequencer wait 30ms -- cool down device 10ms orginale
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